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1 article(s) from Escobar, Juan V

Measuring adhesion on rough surfaces using atomic force microscopy with a liquid probe

Juan V. Escobar,
Cristina Garza and
Rolando Castillo

Beilstein J. Nanotechnol. 2017, 8, 813–825, doi:10.3762/bjnano.8.84

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Figure 1: Test grating. a) Lattice features given by the manufacturer. b) Scanning electron microscopy image ...

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Figure 2: Top panel: AFM profiles of a 60 × 60 μm² portion of the microcrystalline diamond film: (a,b) before...

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Figure 3: Left: Sub-micrometer protrusions on the pyramids of the multi-scaled rough diamond surface; reprodu...

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Figure 4: Scanning electron microscopy image of a mercury drop attached to a tipless cantilever obtained with...

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Figure 5: a) Schematics of the mercury drop–surface system in an AFM. D is the actual distance between mercur...

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Figure 6: Pull-off force vs contact length; the red dash straight line is a guide to the eye. Right inset: A ...

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Figure 7: Results for pull-off force measurements carried out along different surfaces. The pull-off force be...

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Figure 8: Statistics of the whole set of pull-off force measurements. Distribution of the pull-off force betw...

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Figure 9: Adhesion force vs contact length between the array of sharp silicon peaks and (a) a hollow glass sp...

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Figure 10: Distribution of the number of contacts with the array of sharp peaks: a) The number of contacts mad...

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Figure 11: a) Distribution of the number of contacts of the multi-scaled rough diamond surface with the mercur...

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Full Research Paper

Published 10 Apr 2017

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